주요기능
넓은 시야와 선명한 이미지
견고한 73.5mm 작업 거리
대형 XY 스트로크 및 긴 Z 스트로크
높은 반복성을 가진 자동 초점
레이저 AF (옵션)
다양한 조명
지능형 검색
디지털 차트 대조
확장 1.5x 고배율
사양
Model | VMZ-R 3020 | VMZ-R 4540 | VMZ-R 6555 |
XYZ strokes | |||
Type 1, 2, 3 and 4 | 300x200x200mm | 450x400x200mm | 650x550x200mm |
Type TZ with the main objective lens | 300x200x200mm | 450x400x200mm | 650x550x200mm |
Type TZ with the main objective lens | 250x200x200mm | 400x400x200mm | 600x550x200mm |
Type A | 300x200x200mm | 450x400x200mm | 650x550x200mm |
Minimum reading unit | 0.1 micrometer | ||
Maximum weight of specimen | 20kg | 40kg | 50kg |
Uncertainty (L : Length in mm) | |||
EUX, MPE EUY, MPE | 1.2+4L/1000µm | ||
XUXY, MPE | 2+4L/1000µm | ||
Z axis uncertainty (with Laser AF) | 1.2+5L/1000µm | ||
Camera | Black & white 1/3" CCD, 1/3" CCD (Option)* *Color camera option is available only with Type 1, 2 and A | ||
Working distance of objective lens | |||
Type 1, 2 and 3 | 50mm with 37 degree oblique, 36mm with 55 degree oblique angle, 10mm with 78 degree oblique angle | ||
Type 4 | 30mm | ||
Type TZ | 11mm with the main objective lens and 32mm with the left objecive lens. | ||
Type A | 73.5mm without Laser AF, 63mm with Laser AF | ||
Magnification and FOV | |||
Type 1 | 0.5 ~ 7.5x / 9.33x7 ~ 0.622x0.467mm | ||
Type 2 | 1 ~ 15x / 4.67x3.5 ~ 0.311x0.233mm | ||
Type 3 | 2 ~ 30x / 2.33x1.75 ~ 0.155x0.117mm | ||
Type 4 | 4 ~ 60x / 1.165x0.875 ~ 0.07x0.068mm | ||
Type TZ | 1 ~ 120x / 4.67x3.5 ~ 0.039x0.029mm | ||
Type A | 0.35 ~ 3.5x / 13.3x10 ~ 1.33x1mm | ||
Autofocus | Type 1, 2, 3, 4 and TZ are equipped with TTL Laser AF and image AF. Type A is equipped with image AF as standard and with Lase AF as an option | ||
Illuminators | |||
Type 1, 2 and 3 | LED episcopic and diascopic illuminators 8 segment LED inner and outer ring illuminators (37 degree oblique angle with inner ring and 55 and 78 degree oblique angles with outer ring) | ||
Type TZ | LED episcopic illuminator and LED Dark Field illuminator for the main and left objective lenses LED diascopic illuminator for the main objective lens | ||
Type A | LED episcopic and diascopic illuminators 8 segment LED ring illuminator with 18 degree oblique angle | ||
Requirements | AC 100-240V ± 10% 50 or 60 Hz | ||
Consumption of currency | 5A - 2.5A | ||
Dimensions and weight | |||
Main body and table | 700x730x1795mm / approx. 245kg | 1000x1340x1820mm /approx. 500kg | 1200x1640x1820mm /approx. 665kg |
Controller | 190x450x440mm / 15kg | ||
Footprint including a pc on table | 2100x1100mm | 2300x1700mm | 2400x2000mm |
주요기능
Nikon 독점 컨포컬 기술(공초점 기술) 로 동시 광역 높이 측정
15배 브라이트 필드(명시야) 줌 광학을 이용한 2D 측정
반도체 제조에서 300mm 웨이퍼 측정과 완벽 호환
컨포컬 NEXIV 는 웨이퍼 레벨 CSP와 같은 고급 IC 패키지에 있는 다양한 범프 높이 측정 뿐만 아니라
MEMS 와 프로브 카드의 매우 복잡한 구조의 검사에도 최적으로 사용할 수 있습니다.
사양
Objectives | ||||
Magnification | 3x | 7.5x | 15x | 30x |
W.D. | 24mm | 5mm | 20mm | 5mm |
Confocal optics (Area height measurement) | ||||
Maximum scan height | 1mm | |||
Field of view | 4 x 3mm | 1.6 x 1.2mm | 0.8 x 0.6mm | 0.4 x 0.3mm |
Height measurement repeatability (2σ) | 0.35μm | 0.25μm | 0.25μm | 0.20μm |
Height measurement resolution | 0.01μm | |||
Brightfield optics (2D measurement) | ||||
Zooming method | Motorized 5-step zoom | |||
Field of view | 4 x 3mm to 0.27 x 0.2mm | 1.6 x 1.2mm to 0.11 x 0.08mm | 1.26 x 0.95mm to 0.1 x 0.074mm | 0.63 x 0.47mm to 0.05 x 0.04mm |
Illumination | White LED diascopic and episcopic illuminator for all types, White LED ring light for type 3x and 7.5x | |||
Auto focus | Vision AF nd TTL lase AF (Scan Mode available) | |||
Main body | ||||
Stroke (X. Y, Z) | 300 x 400 x 150mm | |||
Guaranteed loading capacity | 20kg | |||
Maximum permissible error MPEE1X | 1.5 + 2.5L/1000µm | |||
Maximum permissible error MPEE1Y | 2.5 + 2.5L/1000µm | |||
Maximum permissible error of Z axis MPEE1Z | 1 + L/1000µm | |||
Main unit weight | 850kg | |||
Power source/power consumption | AC 100 to 240 V ± 10% 50/60 Hz / 13A to 6.5A | |||
Operating condition | Temperature : 20℃ ± 0.5K, Humidity : 70% or less | |||
Acquired standard | CE marking (low voltage/EMC/laser) | |||
Footprint | 2500 x 1600mm |
주요기능
Nikon 독점 컨포컬 기술(공초점 기술) 로 동시 광역 높이 측정
15배 브라이트 필드(명시야) 줌 광학을 이용한 2D 측정
반도체 제조에서 300mm 웨이퍼 측정과 완벽 호환
컨포컬 NEXIV 는 웨이퍼 레벨 CSP와 같은 고급 IC 패키지에 있는 다양한 범프 높이 측정 뿐만 아니라
MEMS 와 프로브 카드의 매우 복잡한 구조의 검사에도 최적으로 사용할 수 있습니다.
사양
Objectives | ||||
Magnification | 3x | 7.5x | 15x | 30x |
W.D. | 24mm | 5mm | 20mm | 5mm |
Confocal optics (Area height measurement) | ||||
Field of view | 4 x 3mm | 1.6 x 1.2mm | 0.8 x 0.6mm | 0.4 x 0.3mm |
Height measurement repeatability (2σ) | 0.35μm | 0.25μm | 0.25μm | 0.20μm |
Height measurement resolution | 0.01μm | |||
Brightfield optics (2D measurement) | ||||
Zooming method | Motorized 5-step zoom | |||
Field of view | 4 x 3mm to 0.27 x 0.2mm | 1.6 x 1.2mm to 0.11 x 0.08mm | 1.26 x 0.95mm to 0.1 x 0.074mm | 0.63 x 0.47mm to 0.05 x 0.04mm |
Illumination | White LED diascopic and episcopic illuminator for all types, White LED ring light for type 3x and 7.5x | |||
Auto focus | Vision AF nd TTL lase AF (Scan Mode available) | |||
Main body | ||||
Stroke (X. Y, Z) | 300 x 400 x 150mm | |||
Guaranteed loading capacity | 30kg | |||
Maximum permissible error MPEE1X | 1.5 + 2.5L / 1000μm | |||
Maximum permissible error MPEE1Y | 2.5 + 2.5L / 1000μm | |||
Maximum permissible error of Z axis MPEE1Z | 1 + L / 1000μm | |||
Main unit weight | 830kg | |||
Power source/power consumption | AC 100 to 240 V ± 10% 50/60 Hz / 13A to 6.5A | |||
Operating condition | Temperature : 20℃ ± 0.5K, Humidity : 70% or less | |||
Acquired standard | CE marking (low voltage/EMC/laser) | |||
Footprint | 2500 x 1900mm |
KM TRADING CO., LTD.
경상남도 양산시 물금읍 백호1길 9 KM빌딩 ㅣ Tel : 055-383-2717, 070-4738-0098 ㅣ Fax : 055-387-2718 ㅣE-mail : kmt@kmtrading.co.kr
안산 전시장 : 경기도 안산시 단원구 연수원로64 ㅣ Tel : 031-414-2717 ㅣ Fax : 031-414-2718 ㅣ E-mail : kmt@kmtrading.co.kr
Copyright ⓒ KM TRADING CO., LTD. All Rights Reserved